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This Standard Reference Material (SRM®) is intended for use as a reference standard for analytical methods that measure the composition of thin films, such as electron microprobe analysis (EMPA), photoluminescence (PL), auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). A unit of NIST-2842 consists of an epitaxial layer of AlxGa1-xAs with certified Al mole fraction x grown on a gallium arsenide (GaAs) substrate mounted to a stainless steel disk by the use of adhesive tape. Each unit is sealed in a Mylar envelope containing a nitrogen atmosphere. /// Sample value(s) - please ask for current certificate.
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NIST provides over 1300 Standard Reference Materials® as well as articles and practice guides describing the development, analysis and use of SRMs.
NIST Standard Reference Materials are used by analytical laboratories in industry, academia and government in order to facilitate commerce and trade and to advance research and development. The SRMs are produced by the engineering laboratory, the material measurement laboratory, and the physical measurement laboratory at NIST. They are available for chemical composition, physical properties, and engineering materials.