Item no.
NIST-2137
Unit
each
Shipment details
No Dangerous Good /not restricted
Back to your search result
Description
This Standard Reference Material (SRM®) is intended for use in calibrating the secondary ion response to minor and trace levels of boron in a silicon matrix by the analytical technique of secondary ion mass spectrometry (SIMS). A unit of NIST-2137 consists of a single crystal silicon substrate with a surface rendered disordered by silicon ion implantation. The substrate is ion-implanted with the isotope 10B at a nominal energy of 50 keV. NIST-2137 is certified for the retained dose of 10B atoms by neutron depth profiling. The dose is expressed in units of 10B mass per unit area. Noncertified information about the concentration of 10B atoms as a function of depth below the surface is provided by SIMS. /// Sample value(s) - please ask for current certificate.
Contents
Miscellaneous
Certificate of Analysis (specimen)
Reference Material CoA specimen: for the current lot, please contact your customer service representative at info@labmix24.com
Product data sheet
View all available product details e.g. description, analytes/parameters, CAS Number, concentrations/values, sales unit/product format, method, source, transport information
NIST provides over 1300 Standard Reference Materials® as well as articles and practice guides describing the development, analysis and use of SRMs.
NIST Standard Reference Materials are used by analytical laboratories in industry, academia and government in order to facilitate commerce and trade and to advance research and development. The SRMs are produced by the engineering laboratory, the material measurement laboratory, and the physical measurement laboratory at NIST. They are available for chemical composition, physical properties, and engineering materials.