Item no.
NIST-2000
Unit
1 block
Shipment details
No Dangerous Good /not restricted
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Description
This Standard Reference Material® (SRM®) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of NIST-2000 consists of 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation.
Contents
Miscellaneous
Certificate of Analysis (specimen)
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Product data sheet
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NIST provides over 1300 Standard Reference Materials® as well as articles and practice guides describing the development, analysis and use of SRMs.
NIST Standard Reference Materials are used by analytical laboratories in industry, academia and government in order to facilitate commerce and trade and to advance research and development. The SRMs are produced by the engineering laboratory, the material measurement laboratory, and the physical measurement laboratory at NIST. They are available for chemical composition, physical properties, and engineering materials.