Calibration standard for high-resolution X-Ray DiffractionZurück zur Übersicht
| Art. Nr. | NIST-2000 |
| Verkaufseinheit | 1 block |
| Transportdaten | No Dangerous Good /not restricted |
Weitere Informationen
This Standard Reference Material® (SRM®) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of NIST-2000 consists of 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation.
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| Please ask for current certificate |