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Description

High Resolution High Resonant Frequency AFM Cantilevers HA_HR series are designed for Semicontact ( Intermittent ), Noncontact applications. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 380kHz / 230kHz (dispersion ±10%), Typical Force Constant 34N/m / 17N/m (dispersion ±20%). Cantilever has Au reflective side coating to increase laser signal. Probes are also available with no coating as well as with conductive tip coating / Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price / High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images: /// Sharp tip - curvature radius < 10 nm /// Resonance frequency, specified with high accuracy - ±10% within a wafer /// Special chip geometry with vertical sidewalls for convenient operating /// High aspect ratio tip /// Enhanced back-side reflection of the cantilever /// Cost effective price