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Description

High Resolution High Resonant Frequency AFM Cantilevers HA_FM/Au series are designed for Semicontact ( Intermittent ), Noncontact and electrical applications (SKM, SCM, SRIM, EFM, LAO Lithography). Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 114kHz / 77kHz (dispersion ±10%). Typical Force Constant 12N/m / 3.5N/m (dispersion ±20%). Cantilever has Au tip and reflective side coatings. Probes are also available without tip coating / High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images: /// Sharp tip - curvature radius < 10 nm. /// Resonance frequency, specified with high accuracy - ±10% within a wafer. /// Special chip geometry with vertical sidewalls for convenient operating. /// High aspect ratio tip. /// Enhanced back-side reflection of the cantilever. /// Cost effective price