Test sample for calibrating AFM scanner movements along the Z axis with step height 1,5nmZurück zur Übersicht
| Art. Nr. | TIPS-SiC/1.5 |
| Verkaufseinheit | Each |
| Transportdaten | No Dangerous Good /not restricted |
| Art. Nr. | TIPS-SiC/1.5 |
| Verkaufseinheit | Each |
| Transportdaten | No Dangerous Good /not restricted |