Rastersondenmikroskopie - Proben und Zubehör

102050100
Art. Nr.BezeichnungEinheitPreis
TIPS-NSG01_DLC/10Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m10 separated chipsBitte anfragenDetails
TIPS-NSG10_DLC/10Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m10 separated chipsBitte anfragenDetails
TIPS-CSG10_SS/10Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating10 separated chipsBitte anfragenDetails
TIPS-FMG01_SS/10Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 40-96kHz, force constant 1-3N/m, typical curvature radius 2nm, Al reflective coating10 separated chipsBitte anfragenDetails
TIPS-NSG30_SS/10Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating10 separated chipsBitte anfragenDetails
TIPS-PFM03Test pattern for Piezoresponce Force MicroscopyEachBitte anfragenDetails
TIPS-SiC/0,75Test sample for calibrating AFM scanner movements along the Z axis with step height 0,75nmEachBitte anfragenDetails
TIPS-SiC/1.5Test sample for calibrating AFM scanner movements along the Z axis with step height 1,5nmEachBitte anfragenDetails
TIPS-VIT_P_C-A/50TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C-A series are specially designed for tip or laser spot precise positioning over the point of interestSet of 50 cantileversBitte anfragenDetails
TIPS-,VIT_P_C-A/25TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C-A series are specially designed for tip or laser spot precise positioning over the point of interestSet of 25 cantileversBitte anfragenDetails
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